Per Hour Charge for use of the Focused Ion Beam (FIB) / Dualbeam Microscope.
The FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument. This allows milling of cross sections (typically 20 x 5 microns) through samples and subsequent imaging using either electrons or ions.
The Dual Beam allows cross sections to be made through defects of delicate surfaces e.g oxides, the preparation of TEM samples from site specific areas where this is impossible using conventional means, ion beam imaging and 3D reconstructions of materials. Features observed can be analysed in situ by EDS and EBSD.
If you would like to obtain the specifications of the systems available please visit the LMCC’s website (www.lboro.ac.uk/lmcc). If you would like any advice on which analytical service can provide you with the best results for your specific investigation or an estimate of how long the analysis will take, please contact us, we will be more than happy to help.
LMCC’s primary aim is to support materials research within the Materials Department and the University as a whole. However, supporting industry by providing specialist services is also seen as a very important part of LMCC’s activities.
The quantity of this product purchased will be equal to the number of hours you have on the system. The cost includes a trained operator to help ensure you get the maximum benefit from your analysis. At the end of the session we shall provide you with any data generated during the session on a CD or USB memory stick.
The online store is a method for pre-paying for time on the analytical equipment available within LMCC. The price is solely for the use of the analytical equipment for the given time period. In order to get the maximum benefit out of the session the sample needs to be prepared correctly. If you have any concerns regarding sample preparation please contact LMCC, we also provide a sample preparation service (at an extra cost) if you would prefer us to handle this.